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Focused ion beam
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51	ORC Postgraduate Cleanroom Course 2012 On every topic there is a 1-hour lecture (Wednesdays[removed]hrs in Mountbatten Seminar Room, [removed]and a practical demonstration session in the following 7 days. Dates and tim Add to Reading List Source URL: www.orc.soton.ac.uk Language: English - Date: 2012-02-07 09:18:19 Thin film deposition Fib Science Electron microscopy Focused ion beam Semiconductor device fabrication
52	Microstructures of presolar Al2O3 grains. A. Takigawa1, R. M. Stroud2, L. R. Nittler3, C. M. O’D. Alexander3, and A. Miyake1, 1Department of Geology and Mineralogy, Kyoto University, Kyoto, Japan, 2Naval Research Labo Add to Reading List Source URL: www.nipr.ac.jp Language: English* - Date: 2014-11-16 09:41:54 Matter Meteorites Space dust Nucleosynthesis Presolar grains Metallurgy Chondrite Focused ion beam Transmission electron microscopy Chemistry Scientific method Electron microscopy
53	Sample Results Summary Sheet Please return this form to the Curator for each allocated Sample Sample ID: RB-QD04[removed] Add to Reading List Source URL: hayabusaao.isas.jaxa.jp Language: English - Date: 2014-12-24 00:09:04 Electron microscopy Science Physics Focused ion beam Fib Ion beam Semiconductor device fabrication Thin film deposition Scientific method
54	Sample Results Summary Sheet Please return this form to the Curator for each allocated Sample Sample ID: RA-QD02-0180 Add to Reading List Source URL: hayabusaao.isas.jaxa.jp Language: English - Date: 2014-12-24 00:09:03 Electron microscopy Physics Science Focused ion beam Fib Ion beam Semiconductor device fabrication Thin film deposition Scientific method
55	Sample Results Summary Sheet Please return this form to the Curator for each allocated Sample Sample ID: RA-QD02-0120 Add to Reading List Source URL: hayabusaao.isas.jaxa.jp Language: English - Date: 2014-12-24 00:09:04 Electron microscopy Science Physics Focused ion beam Fib Ion beam Semiconductor device fabrication Thin film deposition Scientific method
56	Sample Results Summary Sheet Please return this form to the Curator for each allocated Sample Sample ID: RA-QD02-0032 Add to Reading List Source URL: hayabusaao.isas.jaxa.jp Language: English - Date: 2014-12-15 18:58:59 Chemistry Focused ion beam Electron microscope Transmission electron microscopy Scanning electron microscope Microtome Epoxy Nanoparticle Desiccator Scientific method Electron microscopy Science
57	image: Kimin Jun © 2010 Growth of three-dimensional structures with a focused ion beam and nanoclusters. Add to Reading List Source URL: cba.mit.edu - Date: 2011-12-13 18:31:45
58	46th Lunar and Planetary Science Conference[removed]pdf THREE DIMENSIONAL STRUCTURES AND DETAIL MORPHOLOGIES OF AGGREGATE-TYPE ITOKAWA PARTICLES ANALYZED BY DUAL-ENERGY SYNCHROTRON RADIATION COMPUTED TOMOGRAPHY AND Add to Reading List Source URL: www.hou.usra.edu Language: English - Date: 2015-01-06 08:55:06 Planetary geology 25143 Itokawa Hayabusa Regolith Particle Nanoparticle Focused ion beam Electron Space weathering Planetary science Spaceflight Physics
59	Principal New Research Facilities Light Water Reactor Materials Analysis Station (Second Period) Purpose: This analysis station has been equipped in order to reinforce and evolve microstructural analysis techniques of r Add to Reading List Source URL: criepi.denken.or.jp Language: English - Date: 2010-12-28 01:58:38 Focused ion beam Transmission electron microscopy Electron microscope Scanning electron microscope Microscope Characterization Electron Energy-dispersive X-ray spectroscopy Scanning transmission electron microscopy Scientific method Electron microscopy Science
60 $Microscopes / Diffraction / Scanning electron microscope / Spectroscopy / EDAX / Electron microscope / Aspex / Focused ion beam / Electron diffraction / Scientific method / Science / Electron microscopy$	WORLD’S BEST Non-Profit org. uS Postage PAID Permit No 504 Lehigh valley, PA Add to Reading List Source URL: www.lehigh.edu Language: English - Date: 2014-10-20 15:53:55 Microscopes Diffraction Scanning electron microscope Spectroscopy EDAX Electron microscope Aspex Focused ion beam Electron diffraction Scientific method Science Electron microscopy

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